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Um microscópio pessoal de super-resolução que fornece a mesma alta resolução que o N-SIM S.

N-SIM E is a streamlined, affordable super-resolution system that provides double the resolution of conventional light microscopes. Combining N-SIM E and a confocal microscope allows you the flexibility to select a location in the confocal image, and easily switch to view it in super-resolution, enabling the acquisition of more detail.


Lateral resolution (FWHM of beads in xy) 115 nm*1 in 3D-SIM mode
Axial resolution (FWHM of beads in z) 269 nm*1 in 3D-SIM mode
Image acquisition time Up to 1 sec/frame (3D-SIM)
Imaging mode 3D-SIM (Reconstruction method: slice, stack)
Multi-color imaging Up to 3 colors
Compatible laser LU-NV series laser unit

488 nm, 561 nm, 640 nm

Compatible microscope Motorized inverted microscope ECLIPSE Ti2-EPerfect Focus System
Motorized XY stage with encoders
Motorized barrier filter wheel
Piezo Z stage
Objective CFI SR HP Apochromat TIRF 100XC Oil (NA 1.49)
CFI SR HP Apochromat TIRF 100XAC Oil (NA 1.49)
CFI SR Plan Apochromat IR 60XC WI (NA 1.27)
CFI SR Plan Apochromat IR 60XAC WI (NA 1.27)
CFI Plan Apochromat Lambda 60XC (NA 0.95)*2
CFI Plan Apochromat Lambda D 40XC (NA 0.95)*2
Camera ORCA-Fusion BT sCMOS camera (Hamamatsu Photonics K.K.)
Software NIS-Elements AR
NIS-Elements C (for Confocal Microscope)

Both require additional software modules NIS-A 6D and N-SIM Analysis

Operating conditions 20 ℃ to 28 ℃ (± 1.5 ℃)
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